top of page
Latest research
01
Single-shot spectrally resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films
02
One-shot deflectometry for high-speed inline inspection of specular quasi-plane surface
03
Real-time method for fabricating 3D diffractive optical elements on curved surfaces using direct laser lithography
04
Design and Lithographic Fabrication of Elliptical Zone Plate Array with High Fill Factor
bottom of page